The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8362586 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 29, 2013

Filed:

Sep. 07, 2010
Applicant:

Tetsuo Hatakeyama, Kanagawa, JP;

Inventor:

Tetsuo Hatakeyama, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/66 (2006.01);
U.S. Cl.
CPC ...
Abstract

According to one embodiment, a semiconductor device provided with a structure, which prevents withstand voltage deterioration and may be manufactured at a low cost, is provided. The semiconductor device is provided with a semiconductor substrate, a first conductive type semiconductor layer formed of silicon carbide formed on the substrate, an active region formed on a surface of the semiconductor layer, a second conductive type first semiconductor region formed on the surface of the semiconductor layer so as to surround the active region, a second semiconductor region provided on the surface of the semiconductor layer so as to contact the outside of the first semiconductor region to surround the first semiconductor region in which a second conductive type impurity region having impurity concentration and a depth identical to those of the first semiconductor region is formed into a mesh shape, a first electrode provided on the active region, and a second electrode provided on a backside of the semiconductor substrate.


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