The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 2013
Filed:
Mar. 17, 2006
Ute Resch-genger, Berlin, DE;
Katrin Hoffmann, Berlin, DE;
Dietmar Pfeifer, Berlin, DE;
Roland Nitschke, Gundelfingen, DE;
Pierre Nording, Gams SG, CH;
Ute Resch-Genger, Berlin, DE;
Katrin Hoffmann, Berlin, DE;
Dietmar Pfeifer, Berlin, DE;
Roland Nitschke, Gundelfingen, DE;
Pierre Nording, Gams SG, CH;
Bam Bundesanstalf Fuer Materialforschung und - Pruefung, Berlin, DE;
Sigma-Aldrich GmbH, Buchs, CH;
Abstract
A calibration system characterizes luminescence measurement systems, in particular spectrally resolving, wide-field and/or confocal imaging systems. The calibration system has a baseplate with at least one flow-through channel, wherein the at least one channel is formed as a sample chamber for the luminescence measurement system, at least one reservoir in communication with the at least one channel and adapted to receive a liquid, and at least one focusing device integrated into a baseplate for setting a defined measurement beam focus of the luminescence measurement system to be calibrated by using a focusing surface.