The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 2013
Filed:
Mar. 26, 2008
Jean-pierre Chauveau, Charenton le Pont, FR;
Jean-Pierre Chauveau, Charenton le Pont, FR;
Essilor International (Compagnie Generale d'Optique), Charenton-le-Pont, FR;
Abstract
The present invention relates in general to taking geometrico-morphological measurements on a subject. More particularly, the invention relates to a method of measuring the position of a remarkable point of the subject's eye. The method includes amongst others, the steps of capturing images in different relative postures (APIV, APIV, (O,X,Y,Z), (O,X,Y,Z)) of a subject, identifying reference points of the eye ((RCG, RCD), (RCG, RCD)), and calculating the remarkable point (CROD, CROG) as a function of the captured images. The values of the posture parameter (APIV) are obtained by a position-identification element () having at least one known geometrical characteristic that is placed on the subject's head. Each captured image contains a representation of the position-identification element (). The posture parameter is thus calculated as a function of these images and of the known geometrical characteristic.