The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 2013
Filed:
Dec. 09, 2010
Kai Karikomi, Tokyo, JP;
Yosuke Nakamura, Tokyo, JP;
Kai Karikomi, Tokyo, JP;
Yosuke Nakamura, Tokyo, JP;
Mitsubishi Heavy Industries, Ltd., Tokyo, JP;
Abstract
A method of wind tunnel measurement of airfoil, includes a step of providing a wind tunnel test apparatus. The wind tunnel test apparatus includes two walls, two supporting members, and two load measuring units. The method further includes steps of: coupling both ends of an airfoil model under test with the two supporting members, respectively; generating a flow of a fluid in the wind tunnel flow path; and measuring a load applied to the airfoil model by using the two load measuring units. A thin film member is stuck on each end of the airfoil model so that a part of the thin film member protrudes from the each end of the airfoil model along an outer circumference throughout an entire circumference. The thin film member has a strength at which the thin film member enables to endure a pressure of the fluid, and is formed of a material which is elastically deformable. The thin film member is provided so that a gap between the each end of the airfoil model and one of the two walls facing to the each end of the airfoil model is blocked.