The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 22, 2013

Filed:

Dec. 18, 2009
Applicants:

Abhijit Rao, Seattle, WA (US);

Steven J. Steiner, Seattle, WA (US);

Inventors:

Abhijit Rao, Seattle, WA (US);

Steven J. Steiner, Seattle, WA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06F 9/45 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for debugging a computer program by using a call graph. A call graph that represents trace events during execution of a debuggee program may be used as input to a system that enables a user to debug the debuggee program. Mechanisms facilitate conditionally forming clusters of event nodes, a cluster indicative of multiple event nodes corresponding to an execution of a source language statement. During a debugging session, in response to a command to perform a step operation, the nodes of a cluster are processed together so that a step corresponds to multiple events if the multiple events correspond to a single source language statement. A mechanism for inspecting variables is provided. Variable values may be selectively propagated and provided based on the call graph and a static control flow analysis of the debuggee program.


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