The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 22, 2013

Filed:

Aug. 22, 2008
Applicants:

Andy Chou, San Francisco, CA (US);

Sumant J. Kowshik, San Francisco, CA (US);

Inventors:

Andy Chou, San Francisco, CA (US);

Sumant J. Kowshik, San Francisco, CA (US);

Assignee:

Coverity, Inc., San Francisco, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06F 17/50 (2006.01); G06F 9/455 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods are provided that allow a false path pruner to traverse a directed acyclic graph in conjunction with one or more checker programs that are analyzing a program for defects or other artifacts of interest. While the checkers may have ways of avoiding re-traversal of portions of the graph that have already been traversed, the false path pruner may override such decisions made by the checkers as a result of a false path in order to allow re-traversal during a future different traversal when that same defect or artifact may not lie along a false path, and therefore avoid missing a valid defect or artifact. Computer programs stored on tangible media are provided that implement the methods of the invention.


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