The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 22, 2013

Filed:

Oct. 01, 2009
Applicants:

Chao Wang, Plainsboro, NJ (US);

Aarti Gupta, Princeton, NJ (US);

Swarat Chaudhuri, Unversity Park, PA (US);

Yu Yang, Salt Lake City, UT (US);

Inventors:

Chao Wang, Plainsboro, NJ (US);

Aarti Gupta, Princeton, NJ (US);

Swarat Chaudhuri, Unversity Park, PA (US);

Yu Yang, Salt Lake City, UT (US);

Assignee:

NEC Laboratories America, Inc., Princeton, NJ (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

A computer implemented method for the verification of concurrent software programs wherein the concurrent software program is partitioned into subsets named concurrent trace programs (CTPs) and each of the CTPs is evaluated using a satisfiability-based (SAT) symbolic analysis. By applying the SAT analysis to individual CTPs in isolation the symbolic analysis is advantageously more scalable and efficient.


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