The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 22, 2013

Filed:

Apr. 11, 2011
Applicants:

Lu-an Ko, Zhongli, TW;

Xi Chen, Fremont, CA (US);

Arnold Sher, Modiin, IL (US);

Furshing Tsai, San Jose, CA (US);

Inventors:

Lu-An Ko, Zhongli, TW;

Xi Chen, Fremont, CA (US);

Arnold Sher, Modiin, IL (US);

Furshing Tsai, San Jose, CA (US);

Assignees:

Springsoft Inc., Hsinchu, TW;

Springsoft USA, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/455 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods for debugging designs are provided. First, signal correlation information for signals of a design at least two design level is obtained. Then, design descriptions corresponding to the design at the at least two design levels are loaded and presented in at least two sets of windows or at least two debugging processes which controls the respective set of windows. A selection of a first signal in a first set of windows or a first debugging process is received. In response to the selection, a second signal corresponding to the first signal is queried according to the signal correlation information, and the second signal in a second set of windows or a second debugging process is automatically selected.


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