The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 22, 2013
Filed:
May. 18, 2010
Marc Pogosky, North Babylon, NY (US);
Richard Engel, Ridge, NY (US);
Eli Levi, Dix Hills, NY (US);
Advanced Testing Technologies, Inc., Hauppauge, NY (US);
Abstract
A digital functional test system incorporating both digital stimulus and digital response/compare capability for digital electronic circuitry. The system includes a chassis and a single width VME eXtensions for Instrumentation (VXI) module arranged in or on the chassis. The single width VXI module includes a timing sub-module that generates a stimulus clock signal and a response clock signal, eight pattern sub-modules, and a master oscillator sub-module that provides a clock signal. Each pattern sub-module receives the stimulus and response clock signals, and the clock signal from the master oscillator sub-module, and includes a pattern generating module, a stimulus memory component that stores stimulus data outgoing from the pattern generating module, a response memory component that records response data incoming to the pattern generating module, and a compare reference memory component that provides a reference for a compare function of the recorded response data in the response memory component.