The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 22, 2013

Filed:

Sep. 16, 2008
Applicants:

Rolf Fritz, Waldenbuch, DE;

Andreas Koenig, Leonberg, DE;

Christopher Smith, Tamm, DE;

Manfred Walz, Boeblingen, DE;

Inventors:

Rolf Fritz, Waldenbuch, DE;

Andreas Koenig, Leonberg, DE;

Christopher Smith, Tamm, DE;

Manfred Walz, Boeblingen, DE;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods and corresponding test systems for generating a chip facility waveform from a series of chip snapshots. The methods including, (i) testing an integrated chip multiple times, each time increasing a clockstop delay delaying a clockstop generated by triggered error condition each time determining the state of state holding elements of the integrated circuit and (ii) testing an integrated circuit chip one time to generate a error condition and determining multiple times the states of state holding elements of the integrated circuit based on previous states of the state holding elements.


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