The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 22, 2013

Filed:

Feb. 22, 2010
Applicants:

Allon Adir, Kiryat Tivon, IL;

Gil Shurek, Haifa, IL;

Inventors:

Allon Adir, Kiryat Tivon, IL;

Gil Shurek, Haifa, IL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 12/00 (2006.01); G06F 9/26 (2006.01); G06F 9/34 (2006.01); G06F 11/00 (2006.01); G11C 29/00 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

Testing a circuit in a post-silicon stage is performed by enabling the different processing entities of the circuit to determine a consistent access permissions schema in a random manner. Based upon the consistent access permissions schema, addresses to be accessed during the testing of the circuit may be determined. The addresses may be determined in a random manner. The consistent permissions schema may be determined based on a template representative of repetitive portions of access permissions schema. The disclosed subject matter may utilize biasing modules to bias the test generation to provide a test having a predetermined characteristic. The disclosed subject matter may utilize a joint random seed or other techniques to provide for consistent random decisions by the different processing entities.


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