The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 22, 2013

Filed:

Feb. 25, 2004
Applicants:

Hong Gui, Madison, WI (US);

Grace AU, Rancho Palos Verdes, CA (US);

Curt J. Ellmann, Madison, WI (US);

Inventors:

Hong Gui, Madison, WI (US);

Grace Au, Rancho Palos Verdes, CA (US);

Curt J. Ellmann, Madison, WI (US);

Assignee:

Teradata US, Inc., Dayton, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A database system includes database software to receive a query specifying a join of plural base tables, and to determine whether a foreign key and primary key relationship exists between join columns specified by the query and a materialized view definition. Based on the existence of the foreign key and the primary key relationship between join columns specified by the query and the materialized view definition, the database software determines that a result for the received query is to be computed from the materialized view.


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