The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 22, 2013
Filed:
Mar. 01, 2011
Weiyong LI, Doylestown, PA (US);
Weiyong Li, Doylestown, PA (US);
Other;
Abstract
The invention provides a multivariate modeling method for quantitative analysis by supervised principal component analysis (SPCA). The method comprises: (a) designing a plurality of calibration samples wherein the desired variances are dominant or greatly enhanced; (b) producing a calibration data matrix using suitable mathematical pretreatment and truncation of the acquired NIR/Raman spectra of the calibration samples; (c) decomposing the matrix using PCA; (d) evaluating the score and loading matrices to ensure a genuine orthogonal relationship between scores of the desired latent variables in a two-dimensional principal component space; (e) generating a prediction matrix for quantitative prediction of unknown samples. This method does not require testing of calibration samples using a reference method. In addition, this method has high tolerance to variations in sample composition and manufacturing conditions.