The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 22, 2013

Filed:

Oct. 13, 2011
Applicants:

Yasushi Nakazato, Tokyo, JP;

Kohji Ue, Kanagawa, JP;

Jun Yamane, Kanagawa, JP;

Osamu Satoh, Kanagawa, JP;

Masahide Yamashita, Tokyo, JP;

Inventors:

Yasushi Nakazato, Tokyo, JP;

Kohji Ue, Kanagawa, JP;

Jun Yamane, Kanagawa, JP;

Osamu Satoh, Kanagawa, JP;

Masahide Yamashita, Tokyo, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03G 15/00 (2006.01); G06F 3/12 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A management device for an image forming apparatus including a status data collection unit where multiple types of status data are received from the image forming apparatus and stored in a status database, a target data creation unit where multiple types of target data are created based upon the multiple types of status data, a first stage determination unit where the multiple types of target data are identified as being above or below reference values set for each type, and a second stage determination unit where a weight value set for each status data type is attached to the determination results of the multiple types of status data of the first stage determination unit and as a whole of the multiple types of status data determined with majority logic for abnormal occurrence prediction.


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