The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 22, 2013
Filed:
Nov. 14, 2011
Christopher O. Jaynes, Lexington, KY (US);
Stephen B. Webb, Lexington, KY (US);
Christopher O. Jaynes, Lexington, KY (US);
Stephen B. Webb, Lexington, KY (US);
Mersive Technologies, Inc., Frankfort, KY (US);
Abstract
A method of calibrating a multi-projector image display system is provided. According to the method, non-parametric calibration data for the display system is recovered and used to generate a non-parametric model of the display system. Local parametric models relating to the display surface of the projection screen are generated and are compared with data points defined by the non-parametric calibration data to identify one or more local errors in the non-parametric calibration data. The local errors in the non-parametric calibration data are converted to data points defined at least in part by the local parametric models and the projectors are operated to project an image on the image projection screen by utilizing a hybrid calibration model comprising data points taken from the non-parametric model and data points taken from one or more local parametric models. Additional embodiments are disclosed and claimed.