The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 22, 2013

Filed:

Mar. 10, 2008
Applicants:

Nicolas J. Merlet, Jerusalem, IL;

Philippe Nathan Bamberger, Jerusalem, IL;

Inventors:

Nicolas J. Merlet, Jerusalem, IL;

Philippe Nathan Bamberger, Jerusalem, IL;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for adapting a detection algorithm developed for usage with data generated by a first system to data generated with a second system, the algorithm for fail safe diagnosis of irregularities including a first procedure of detecting irregularities with minimal type I errors and a second procedure of filtering out type II errors; the data generated including values for selected features characterizing the irregularities; the method including applying an intermediate step of linearly transposing the values of each selected feature generated by the first procedure, prior to applying the second procedure to those values.


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