The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 22, 2013
Filed:
Sep. 14, 2009
Applicants:
Ming Cai, Fremont, CA (US);
Ruibo Wang, Oak Park, CA (US);
Inventors:
Ming Cai, Fremont, CA (US);
Ruibo Wang, Oak Park, CA (US);
Assignee:
Oclaro (North America), Inc., San Jose, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 5/30 (2006.01);
U.S. Cl.
CPC ...
Abstract
Delay line interferometer designs using combinations of basic optical components that are expected to simplify manufacture and reduce costs while still providing precision optical performance. The main operative components of these designs are polarization beam splitters, birefringent crystals, optical delay components, and waveplates. Temperature controllers may be provided for adjusting the delay of the optical delay components.