The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 22, 2013
Filed:
Jan. 15, 2010
Norihiko Utsunomiya, Machida, JP;
Norihiko Utsunomiya, Machida, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
In an optical tomographic imaging apparatus in which a tomographic image is acquired using an interference light between a return beam of a first measuring beam and a first reference beam traveling on a beam path having first beam path length changing unit thereon, an optical interferometer detects movement of the inspection object by using an interference light between a return beam of a second measuring beam from a movement detection position and a second reference beam traveling on a beam path having second beam path length changing unit thereon; and positional misplacement correcting unit changes the beam path length of the first reference beam based on the moving amount detected by the optical interferometer, wherein the beam path lengths of the two reference beams can be changed by a mechanism, thus further reducing deformation of an acquired image in an eye ball depth direction caused by a back and forth motion.