The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 22, 2013
Filed:
Feb. 26, 2010
Kristin Marie Dewitt, Vienna, VA (US);
Merrick Joseph Dewitt, Vienna, VA (US);
Kristin Marie DeWitt, Vienna, VA (US);
Merrick Joseph DeWitt, Vienna, VA (US);
System Planning Corporation, Arlington, VA (US);
Abstract
A spectrometer for identifying an analyte material. One embodiment of the spectrometer includes a single ultrashort pulsed laser (USPL) source, a fiber interferometer, a frequency converter and a transceiver. The USPL source is configured to generate a laser beam. The interferometer is operatively coupled to the USPL source, and is configured to split the laser beam into a first laser beam and a second laser beam, providing a variable difference in lengths between the paths of the first laser beam and the second laser beam. The spectrometer then electronically scans the variable-path second laser beam over the first laser beam to generate interferogram patterns. The frequency converter is configured to receive the interferogram patterns from the interferometer, and perform a frequency conversion of the interferogram patterns to form an output beam. The transceiver is configured to transmit the output beam and to receive radiation from the analyte material. The radiation is thereafter used to identify the analyte material.