The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 22, 2013

Filed:

Mar. 10, 2006
Applicants:

Michael L. Myrick, Irmo, SC (US);

Robert P. Freese, Pittsboro, NC (US);

Ryan J. Priore, Columbia, SC (US);

John C. Blackburn, Charleston, SC (US);

Jonathan H. James, Columbia, SC (US);

David L. Perkins, Irmo, SC (US);

Inventors:

Michael L. Myrick, Irmo, SC (US);

Robert P. Freese, Pittsboro, NC (US);

Ryan J. Priore, Columbia, SC (US);

John C. Blackburn, Charleston, SC (US);

Jonathan H. James, Columbia, SC (US);

David L. Perkins, Irmo, SC (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/55 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of real-time processing and monitoring comprises the steps of blending a material of interest (e.g., an active pharmaceutical material), with a secondary material, (e.g., an excipient), illuminating the blended materials with light, reflecting light carrying information about the blended materials through at least one multivariate optical element () and detecting said light with a first detector (), detecting a deflected portion of the information carrying light with a second detector (), and determining in real-time at least one selected property of the blended materials based on the detector outputs.


Find Patent Forward Citations

Quick Actions:

Myrick, Michael. (2013). Optical analysis system for dynamic real-time detection and measurement (U.S. Patent No. 8358418). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8358418

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…