The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 22, 2013
Filed:
Feb. 14, 2011
Alfred Feitisch, Los Gatos, CA (US);
Lutz Keller, Fontana, CA (US);
Xiang Liu, Rancho Cucamonga, CA (US);
Mathias Schrempel, Alta Loma, CA (US);
Keith Benjamin Helbley, Riverside, CA (US);
Alfred Feitisch, Los Gatos, CA (US);
Lutz Keller, Fontana, CA (US);
Xiang Liu, Rancho Cucamonga, CA (US);
Mathias Schrempel, Alta Loma, CA (US);
Keith Benjamin Helbley, Riverside, CA (US);
SpectraSensors, Inc., Rancho Cucamonga, CA (US);
Abstract
A valid state of an analytical system that includes a light source and a detector can be verified by determining that deviation of first light intensity data quantifying a first intensity of light received at the detector from the light source after the light has passed at least once through each of a reference gas in a validation cell and a zero gas from a stored data set does not exceed a pre-defined threshold deviation. The stored data set can represent at least one previous measurement collected during a previous instrument validation process performed on the analytical system. The reference gas can include a known amount of an analyte. A concentration of the analyte in a sample gas can be determined by correcting second light intensity data quantifying a second intensity of the light received at the detector after the light passes at least once through each of the reference gas in the validation cell and a sample gas containing an unknown concentration of the analyte compound. Related systems, methods, and articles of manufacture are also described.