The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 22, 2013
Filed:
Nov. 01, 2010
Shreyas Sen, Atlanta, GA (US);
Shyam Kumar Devarakond, Atlanta, GA (US);
Abhijit Chatterjee, Marietta, GA (US);
Shreyas Sen, Atlanta, GA (US);
Shyam Kumar Devarakond, Atlanta, GA (US);
Abhijit Chatterjee, Marietta, GA (US);
Georgia Tech Research Corporation, Atlanta, GA (US);
Abstract
The presently invention is directed to ways to measure distortion effects while allowing for the possibility of significant reduction in test cost. An exemplary embodiment of the present invention provides a method for amplifier distortion measurement including comparing a first amplitude response of an output signal from a power amplifier to a second amplitude response of a reference input signal to determine a set of Amplitude-to-Amplitude ('AM-AM') distortion values. Additionally, the method for amplifier distortion measurement includes equalizing the first amplitude response of the output signal to match the second amplitude response of the reference input signal based on the set of AM-AM distortion values and creating a difference signal based on a comparison of the equalized output signal to the reference input signal. Furthermore, the method for amplifier distortion measurement includes calculating a set of Amplitude-to-Phase ('AM-PM') distortion values based on a third amplitude response of the difference signal.