The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 22, 2013
Filed:
Mar. 24, 2010
Motohiro Suyama, Hamamatsu, JP;
Etsuo Iizuka, Hamamatsu, JP;
Akio Suzuki, Hamamatsu, JP;
Hiroshi Kobayashi, Hamamatsu, JP;
Motohiro Suyama, Hamamatsu, JP;
Etsuo Iizuka, Hamamatsu, JP;
Akio Suzuki, Hamamatsu, JP;
Hiroshi Kobayashi, Hamamatsu, JP;
Hamamatsu Photonics K.K., Hamamatsu-shi, Shizuoka, JP;
Abstract
A mass spectrometer that allows easy replacement of an MCP (microchannel plate) and is enabled to secure orthogonality between an incident surface of the MCP and an ion track at high accuracy is provided. A flight tubewhere ions fly is arranged in a vacuum vessel composed of a vacuum flangeand a body, and an MCP groupis attached to a tail end of the flight tubevia an MCP-IN electrode. A vacuum flangeis attachably and detachably attached to the body, and the MCP group, by a springprovided on a circuit boardfor detection attached to the vacuum flange, is urged toward an end portion of the flight tubeso that its orthogonality with respect to an ion flight track is secured.