The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 22, 2013
Filed:
Nov. 26, 2008
Applicants:
Youssouf Badal, Fremont, CA (US);
Ahmed Chenna, Sunnyvale, CA (US);
Syed Hasan Tahir, Foster City, CA (US);
Yuping Tan, Freemont, CA (US);
Inventors:
Youssouf Badal, Fremont, CA (US);
Ahmed Chenna, Sunnyvale, CA (US);
Syed Hasan Tahir, Foster City, CA (US);
Yuping Tan, Freemont, CA (US);
Assignee:
Laboratory Corp. of America Holdings, Burlington, NC (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/447 (2006.01);
U.S. Cl.
CPC ...
Abstract
The invention relates to an enhanced method of detecting and/or quantifying at least one analyte in a sample.
Quick Actions:
Badal, Youssouf. (2013). Enhanced method for detecting and/or quantifying an analyte in a sample (U.S. Patent No. 8357277). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8357277
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile