The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 15, 2013

Filed:

Jul. 22, 2010
Applicants:

Nam IL Kim, Daejeon, KR;

Daeho Kim, Daejeon, KR;

Inventors:

Nam Il Kim, Daejeon, KR;

Daeho Kim, Daejeon, KR;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A data derate matcher for supporting hybrid automatic repeat request (HARQ), includes a control parameter generation unit for generating control parameters to separate bits of an input bit stream e; and a bit separation unit for separating the bits of the input bit stream einto three types of bits streams vk, vk, and vk by modulus operation of each of the bits of the input bit stream and the control parameters. Further, the data derate matcher for supporting the HARQ includes address generators for generating addresses (j) of valid data to be used in deinterleavers with respect to data of each of the bit streams output from the bit separation unit; and subblock deinterleavers for sequentially inputting data corresponding to the addresses generated by the address generators to output decoded data.


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