The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 15, 2013
Filed:
Jan. 18, 2011
Bosco Chun Sang Lai, Markham, CA;
Sunny Lai-ming Chang, Markham, CA;
Lawrence Wai Cheung Ho, Mississauga, CA;
Shu Man Choi, Markham, CA;
Bosco Chun Sang Lai, Markham, CA;
Sunny Lai-Ming Chang, Markham, CA;
Lawrence Wai Cheung Ho, Mississauga, CA;
Shu Man Choi, Markham, CA;
Kingtiger Technology (Canada) Inc., Markham, Ontario, CA;
Abstract
A testing apparatus for analyzing a memory module under test operating within an application system, wherein the memory module under test is coupled to a processor of the application system, is disclosed herein. In at least one embodiment, the testing apparatus comprises a first interface for coupling to the application system, a second interface for coupling to a reference memory module, a controller coupled to the first and second interfaces, at least one comparator, and a data logging unit. The data logging unit is configured to receive logging data from the controller and at least one test result from the at least one comparator, and to record, in a memory, at least a subset of the logging data, such that more specific details of memory errors revealed during behavioral testing of memory modules may be identified, examined, and stored for subsequent analysis.