The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 15, 2013
Filed:
Sep. 14, 2009
Applicants:
Steven T. Tye, Hopkinton, MA (US);
Michael Bedy, Merrimack, NH (US);
Richard L. Ford, Redmond, WA (US);
Alex Shye, Evanston, IL (US);
Inventors:
Steven T. Tye, Hopkinton, MA (US);
Michael Bedy, Merrimack, NH (US);
Richard L. Ford, Redmond, WA (US);
Alex Shye, Evanston, IL (US);
Assignee:
Advanced Micro Devices, Inc., Sunnyvale, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/38 (2006.01); G06F 9/00 (2006.01); G06F 9/44 (2006.01); G06F 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
An approach to region selection which extends beyond traces and selects super-regions. A super-region (SR) contains arbitrary control flow, such as interprocedural nested loops, that provides a larger scope for transformation (e.g. optimization) than traces. Hardware samples are used to identify SRs that contain the hot code of a client process without requiring any static program information.