The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 15, 2013
Filed:
Feb. 18, 2010
Applicants:
Amir Averbuch, Jaffa, IL;
Ronald R. Coifman, North Haven, CT (US);
Gil David, Shoresh, IL;
Inventors:
Assignee:
Other;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for hierarchical clustering comprises multi-level partitioning of data points into non-overlapping LDFs and formation of sets of such LDFs, wherein original data points may reside in different LDFs. The sets of LDFs are then hierarchically processed into sets of super-LDFs, which are further processed up the hierarchy. In some embodiments, the further processing ends with the construction of a single super-LDF at the root of the hierarchy. The partitioning of the data points and the hierarchical processing of the sets of LDFs and super-LDFs uses respective local affinity matrices.