The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 15, 2013
Filed:
Jun. 18, 2012
Applicants:
Alok Govil, Santa Clara, CA (US);
Kostadin Djordjev, San Jose, CA (US);
Alan Lewis, Sunnyvale, CA (US);
Wilhelmus Johannes Robertus Van Lier, San Diego, CA (US);
Inventors:
Alok Govil, Santa Clara, CA (US);
Kostadin Djordjev, San Jose, CA (US);
Alan Lewis, Sunnyvale, CA (US);
Wilhelmus Johannes Robertus Van Lier, San Diego, CA (US);
Assignee:
QUALCOMM MEMS Technologies, Inc., San Diego, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 19/00 (2006.01); G06F 19/00 (2011.01);
U.S. Cl.
CPC ...
Abstract
Methods and devices to measure voltage margins of electromechanical devices are disclosed. The voltage margins are determined based on responses to test voltages which cause the devices to change states. State changes of the devices are detected by monitoring integrated current or charge used to drive the devices with the test voltages.