The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 15, 2013
Filed:
Dec. 06, 2005
Bernhard Gleich, Hamgburg, DE;
Jurgen Weizenecker, Hamburg, DE;
Tim Nielsen, Hamburg, DE;
Koninklijke Philips Electronics N.V., Eindhoven, NL;
Abstract
The invention relates to a method of determining a spatial distribution of magnetic particles in an examination zone, in which a magnetic field is generated that has a first sub-zone of lower magnetic field strength and a second sub-zone of higher magnetic field strength. The positions of the two sub-zones are changed, as a result of which the magnetization in the examination zone changes. Measured values that depend on the change in magnetization are acquired. A reference response function by means of which measured values can be determined mathematically from a spatial distribution of magnetic particles is then determined by means of at least extensive magnetic specimen distribution. Finally, the spatial distribution of magnetic particles is reconstructed from the measured values by means of the reference response function.