The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 15, 2013

Filed:

Mar. 06, 2008
Applicants:

Noam Noy, Natanya, IL;

Amit Stekel, Tel Aviv, IL;

Inventors:

Noam Noy, Natanya, IL;

Amit Stekel, Tel Aviv, IL;

Assignee:

Advanced Vision Technology (AVT) Ltd., Neve Ne'eman, Hod Hasharon, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/46 (2006.01); G02B 5/32 (2006.01); G01N 21/86 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system detects an object contour with an image acquisition assembly, the object moving relative to the assembly. A line detector scans the surface line by line during a scan cycle, the line being transverse to the relative motion direction. During active periods, a light source emits light synchronized with the scan cycle, allowing the line detector to acquire a first group of at least one lit scan line. A second group of unlit scan line(s) is acquired during non-emitting idle periods. The object passes between the line detector and the light source. A processor receives and analyzes acquired scan lines. For each lit scan line group and a successive second unlit scan line group, the processor identifies a token pattern with a lit segment adjoining an unlit segment. The processor searches the first and second groups for the token pattern ending or reappearing to produce an object contour.


Find Patent Forward Citations

Loading…