The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 15, 2013
Filed:
Jun. 30, 2009
Masato Kasahara, Hamamatsu, JP;
Toshio Shibuya, Okazaki, JP;
Masato Kasahara, Hamamatsu, JP;
Toshio Shibuya, Okazaki, JP;
Nisshinbo Holdings Inc., Tokyo, JP;
Abstract
A photovoltaic devices inspection apparatus and method of determining defects in photovoltaic devices that uses electroluminescence can find both the quality of the photovoltaic devices from the state of electroluminescence and the possibility of the photovoltaic devices becoming defective in the future by applying constant electric current to the photovoltaic devices causing electroluminescence of the photovoltaic devices (S), photographing the light emitted from each photovoltaic cell of the photovoltaic devices (S), dividing the photographed image of the photovoltaic cell into a bright region and dark region by using a threshold value and displayed as an enhanced image by binarization, analyzing as classifying each photovoltaic cell defect according to defect types and comparing a shape of the dark region with the defect types (S), determining the existence of the defect to perform a positive-negative quality judgment on the photovoltaic devices, and displaying images of the problematic regions for visual inspection (S).
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile