The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 15, 2013
Filed:
Aug. 05, 2003
Jean-michel Lagrange, Moissy-Cramayel, FR;
Claude Cohen-bacrie, Manhattan, NY (US);
Claire Levrier, Rueil-Malmaison, FR;
Nicolas Villain, Clamart, FR;
Robert R. Entrekin, Kirkland, WA (US);
Jean-Michel Lagrange, Moissy-Cramayel, FR;
Claude Cohen-Bacrie, Manhattan, NY (US);
Claire Levrier, Rueil-Malmaison, FR;
Nicolas Villain, Clamart, FR;
Robert R. Entrekin, Kirkland, WA (US);
Koninklijke Philips Electronics N.V., Eindhoven, NL;
Abstract
An ultrasonic imaging apparatus using a method for combining CMB images of the same object including a step of seeking representative contours CNT of an interface on the images to be combined IM,[I], IM[J] is disclosed. The step is intended to define interest areas IA[I], IA[J] in the vicinity of the representative contours. The method also includes analyzing the interest areas IA[I], IA[J] being intended to allocate weights W[I], W[J] to the points on the interest areas IA[I], IA[J] and to the points corresponding to the interest areas IA[I], IA[J] on the various images. The method also includes constructing a combination image IM, a point on the combination image IMcorresponding to a point on at least one interest area IA being obtained from a weighting of the corresponding points on the images to be combined IM[I], IM[J] according to the weights W[I], W[J] allocated in the analysis step ANA.