The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 15, 2013
Filed:
Jan. 16, 2009
Yuzuru Iwasaki, Kanagawa, JP;
Tsutomu Horiuchi, Kanagawa, JP;
Michiko Seyama, Kanagawa, JP;
Toru Miura, Kanagawa, JP;
Tsuneyuki Haga, Kanagawa, JP;
Tsuyoshi Hayashi, Kanagawa, JP;
Yuzuru Iwasaki, Kanagawa, JP;
Tsutomu Horiuchi, Kanagawa, JP;
Michiko Seyama, Kanagawa, JP;
Toru Miura, Kanagawa, JP;
Tsuneyuki Haga, Kanagawa, JP;
Tsuyoshi Hayashi, Kanagawa, JP;
Nippon Telegraph and Telephone Corporation, Tokyo, JP;
Abstract
A surface plasmon resonance measuring device includes a light source () which irradiates, with condensed light, a sample cell () having the characteristic structure of the reflectance of light that is formed in advance as a code from at least either of a substance film to be measured and a substance film different from the substance film to be measured, from a surface opposite to one on which the substance film to be measured is immobilized to a metal thin film, a CCD camera () which detects light reflected by the sample cell (), and a data processing device () which extracts the identification code of the sample cell () from the feature of an image sensed by the camera ().