The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 15, 2013

Filed:

Dec. 30, 2009
Applicants:

Shane C. Dultz, Westlake Village, CA (US);

David Ralin, South Pasadena, CA (US);

Inventors:

Shane C. Dultz, Westlake Village, CA (US);

David Ralin, South Pasadena, CA (US);

Assignee:

Maven Technologies, LLC, Monrovia, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/55 (2006.01);
U.S. Cl.
CPC ...
Abstract

In one embodiment, an apparatus is provided for testing for the presence of analytes in a sample. The apparatus comprises a source of light directed at the bottom surface of a substrate to achieve total internal reflection and to generate an evanescent field. An array of capture elements is immobilized on the top surface of the substrate. The bottom surface of the substrate is configured as a sawtooth (in cross section), the 'teeth' aligned with the rows or the columns in the array. The outer faces of the sawtooth 'prisms' are non-parallel to the substrate top surface, and specific requirements are imposed on the prism light-entrance face, and the substrate thickness and refractive index.


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