The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 15, 2013
Filed:
Nov. 12, 2009
Jiulin Xia, Germantown, MD (US);
Richard L. Mantefuel, Laytonsville, MD (US);
Carl Theodore Edens, Highland, MD (US);
Jonathan Matthew Miller, Burke, VA (US);
Nadia P. Allen, Montgomery Village, MD (US);
Jiulin Xia, Germantown, MD (US);
Richard L. Mantefuel, Laytonsville, MD (US);
Carl Theodore Edens, Highland, MD (US);
Jonathan Matthew Miller, Burke, VA (US);
Nadia P. Allen, Montgomery Village, MD (US);
Qiagen Gaithersburg, Inc., Gaithersburg, MD (US);
Abstract
A sample adequacy measurement system having sample tubes and a housing having a receptacle to receive the sample tubes. The housing has sample adequacy measurement stations that each have a light source and a sample detector. The light source generates an illumination beam directed into one of the sample tubes. The sample detector is positioned along the tube, and receives at least a portion of the illumination beam scattered by turbidity in the sample tube. The detector is positioned at the end of an emitted beam path that extends in a plane that is perpendicular to the vertical direction and is oriented at a non-perpendicular angle with respect to the longitudinal axis of the sample tube unit. This reduce the likelihood that the emitted beam will pass through a damaged portion of the respective one of the sample tubes by passing the light through a protected portion of the tube.