The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 15, 2013
Filed:
Apr. 18, 2012
Kazuhiro Ogawa, Tokyo-to, JP;
Hiroto Shibuya, Tokyo-to, JP;
Shigeyuki Yamaguchi, Tokyo-to, JP;
Ryousuke Miyoshi, Tokyo-to, JP;
You Sasaki, Tokyo-to, JP;
Hiroyuki Konno, Dublin, CA (US);
Jeffrey Robert Deboer, Livermore, CA (US);
Kazuhiro Ogawa, Tokyo-to, JP;
Hiroto Shibuya, Tokyo-to, JP;
Shigeyuki Yamaguchi, Tokyo-to, JP;
Ryousuke Miyoshi, Tokyo-to, JP;
You Sasaki, Tokyo-to, JP;
Hiroyuki Konno, Dublin, CA (US);
Jeffrey Robert DeBoer, Livermore, CA (US);
Kabushiki Kaisha TOPCON, Tokyo-to, JP;
Abstract
A laser scanner measuring system is disclosed, which has a laser scanner and a calibration target. The laser scanner comprises a light emitting element for emitting a pulsed laser beam, a rotary projecting unit for projecting the pulsed laser beam, a distance measuring unit, and a control unit for driving and controlling the light emitting element and the distance measuring unit. The calibration target has a reflection sector with a known shape and with high reflectance and is installed at a known position. In use, there is a step for judging a reflected pulsed laser beam from the reflection sector by detecting a level of light quantity, a step for determining a center position of the reflection sector based on the result of the judgment, and a step for calibrating the laser scanner measuring system based on the determined center position and on the known position.