The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 15, 2013

Filed:

Nov. 22, 2010
Applicants:

Gilbert M. Shows, Plano, TX (US);

Jacob Kim, Dallas, TX (US);

Inventors:

Gilbert M. Shows, Plano, TX (US);

Jacob Kim, Dallas, TX (US);

Assignee:

Raytheon Company, Waltham, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01Q 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus for determining alignment of a first subsystem relative to a second subsystem. The apparatus includes a first antenna system for simultaneously transmitting a delta pattern radiation beam at a first frequency and a sum pattern radiation beam at a second frequency. The apparatus also includes a second antenna system for receiving the delta pattern radiation beam at the first frequency and the sum pattern radiation beam at the second frequency. The apparatus also includes a processor to process the received delta pattern radiation beam and sum pattern radiation beam to determine if a predetermined alignment criterion between the first antenna system and the second antenna system is satisfied.


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