The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 15, 2013

Filed:

Jul. 19, 2010
Applicant:

Bruce H. Dean, New Market, MD (US);

Inventor:

Bruce H. Dean, New Market, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 13/86 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed herein are systems, methods, and non-transitory computer-readable storage media for radio phase retrieval. A system practicing the method gathers first data from radio waves associated with an object observed via a first aperture, gathers second data from radio waves associated with the object observed via an introduced second aperture associated with the first aperture, generates reduced noise data by incoherently subtracting the second data from the first data, and performs phase retrieval for the radio waves by modeling the reduced noise data using a single Fourier transform. The first and second apertures are at different positions, such as side by side. This approach can include determining a value Q which represents a ratio of wavelength times a focal ratio divided by pixel spacing. This information can be used to accurately measure and correct alignment errors or other optical system flaws in the apertures.


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