The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8354850 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 15, 2013

Filed:

Jul. 16, 2008
Applicants:

Joern Soerensen, Aabyhoej, DK;

Henrik Riehm Soerensen, Silkeborg, DK;

Inventors:

Joern Soerensen, Aabyhoej, DK;

Henrik Riehm Soerensen, Silkeborg, DK;

Assignee:

Shelltec A/S, Aabyhoej, DK;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/26 (2006.01); G08B 13/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for detecting the presence, and/or determining the location, and/or detecting changes in the material properties, of a first object () within a predefined space () and compensating for the disturbance caused by a second object, where the method comprises the following steps: providing at least a first and a second electrode () capacitively coupled to each other; conductively applying an electrical signal to each of the first and second electrodes (), the electrical signals being different for the first and second electrodes (); for each of the electrodes () measuring the current signal through, and/or the voltage signal on, the electrode (); deriving from the measured values an indication of the disturbance caused by the second object; and deriving from the measured values and the indication of the disturbance a disturbance-compensated indication of the presence, and/or the location, and/or changes in the material properties, of the first object ().


Find Patent Forward Citations

Soerensen, Joern. (2013). Methods and systems for detecting the presence, or determining the location or the size, or detecting changes of material properties, of an object within a predefined space (U.S. Patent No. 8354850). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8354850

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