The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 15, 2013
Filed:
Jun. 30, 2010
Philip R. Bingham, Knoxville, TN (US);
James Allen Mullens, Farragut, TN (US);
Philip R. Bingham, Knoxville, TN (US);
James Allen Mullens, Farragut, TN (US);
UT-Battelle, LLC, Oak Ridge, TN (US);
Abstract
An imaging system and method of imaging are disclosed. The imaging system can include an external radiation source producing pairs of substantially simultaneous radiation emissions of a picturization emission and a verification emissions at an emission angle. The imaging system can also include a plurality of picturization sensors and at least one verification sensor for detecting the picturization and verification emissions, respectively. The imaging system also includes an object stage is arranged such that a picturization emission can pass through an object supported on said object stage before being detected by one of said plurality of picturization sensors. A coincidence system and a reconstruction system can also be included. The coincidence can receive information from the picturization and verification sensors and determine whether a detected picturization emission is direct radiation or scattered radiation. The reconstruction system can produce a multi-dimensional representation of an object imaged with the imaging system.