The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 15, 2013
Filed:
Feb. 13, 2008
Takashi Yasuda, Hamamatsu, JP;
Yoichi Kawada, Hamamatsu, JP;
Hironori Takahashi, Hamamatsu, JP;
Shinichiro Aoshima, Hamamatsu, JP;
Atsuko Aoshima, Hamamatsu, JP;
Takashi Yasuda, Hamamatsu, JP;
Yoichi Kawada, Hamamatsu, JP;
Hironori Takahashi, Hamamatsu, JP;
Shinichiro Aoshima, Hamamatsu, JP;
Hamamatsu Photonics K.K., Hamamatsu-shi, Shizuoka, JP;
Abstract
A total reflection terahertz wave measuring apparatusis configured to acquire information on a subject S by a total reflection measurement method by use of a terahertz wave, and includes a light source, a branching part, a chopper, an optical path length difference adjusting part, a polarizer, a separator, a terahertz wave generating element, an internal total reflection prism, a terahertz wave detecting element, a ¼ wavelength plate, a polarization split element, a photodetectorA, a photodetectorB, a differential amplifier, and a lock-in amplifier. The internal total reflection prismis a so-called aplanatic prism, and has an entrance plane, an exit plane, and a reflection plane. The terahertz wave generating elementis provided to be integrated with the entrance planeof the internal total reflection prism, and the terahertz wave detecting elementis provided to be integrated with the exit planeof the internal total reflection prism