The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 15, 2013

Filed:

May. 23, 2005
Applicants:

Yuji Oki, Fukuoka, JP;

Satoru Kuhara, Fukuoka, JP;

Inventors:

Yuji Oki, Fukuoka, JP;

Satoru Kuhara, Fukuoka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/06 (2006.01); G01N 33/00 (2006.01); G01N 33/48 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides an inspection chip using light, which is able to provide an irradiation of light at a high precision. The present invention further provides an inspection chip capable of carrying out the inspection of a sample in a simple manner by using a plurality of lights. The inspection chip of the present invention comprises a light amplifier element and a sample holding section for holding a sample, in which the light amplifier element is oriented so as to face to the sample holding section, so that the light emitted from the light amplifier element can irradiate the sample held in the sample holding section.


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