The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8353246 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 15, 2013

Filed:

Mar. 18, 2010
Applicant:

Hiroyoshi Kamoda, Noda, JP;

Inventor:

Hiroyoshi Kamoda, Noda, JP;

Assignee:

Komori Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41F 1/30 (2006.01); B65H 83/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided is a quality inspection apparatus including: gripper units provided to each delivery chain, each gripper unit configured to hold an end portion of a sheet; an arc-shaped track portion provided in a part of a movement track of the gripper units and formed by the movement track; an inspection unit installed at an opposite side of the arc-shaped track portion from an arc center of the arc-shaped track portion; and a vacuum cylinder installed at the same side of the arc-shaped track portion as the arc center. In the apparatus, while running along the arc-shaped track portion, the sheet is inspected by the inspection unit under a guidance of the vacuum cylinder.


Find Patent Forward Citations

Kamoda, Hiroyoshi. (2013). Quality inspection apparatus for sheet-shaped matter (U.S. Patent No. 8353246). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8353246

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…