The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 15, 2013
Filed:
May. 08, 2009
Applicants:
Dae-sung Cheon, Daejeon, KR;
Yong-bok Jung, Daejeon, KR;
Eui-sub Park, Daejeon, KR;
Chan Park, Daejeon, KR;
Joong-ho Synn, Daejeon, KR;
Inventors:
Dae-Sung Cheon, Daejeon, KR;
Yong-Bok Jung, Daejeon, KR;
Eui-Sub Park, Daejeon, KR;
Chan Park, Daejeon, KR;
Joong-Ho Synn, Daejeon, KR;
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
E21B 49/00 (2006.01); G01V 1/40 (2006.01);
U.S. Cl.
CPC ...
Abstract
Provided is a measuring apparatus with AE sensors, which detects the same AE signals with respect to the same events that damage a geotechnical structure, regardless of ground conditions and formations in the geotechnical structure, thereby collecting reliable AE signals. Also, provided is(are) an installing method of the measuring apparatus with the AE sensor, and a set of the measuring apparatus with the AE sensor.