The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 15, 2013
Filed:
Nov. 21, 2008
Nigel Laxton, Mt. Hawthorn, AU;
Henry Kroker, Osborne Park, AU;
Nigel Laxton, Mt. Hawthorn, AU;
Henry Kroker, Osborne Park, AU;
Structural Monitoring Systems Ltd., Osborne Park, AU;
Abstract
A differential comparative pressure monitoring system () for monitoring the structural integrity of a structure () has a pressure source (); a first fluidic circuit (), and a reference fluidic circuit () which are connected in parallel to the pressure source (); and a monitoring device (). The first and reference fluidic circuits () and () have substantially matched characteristics. The first circuit () has a sensor element () which is sealed to a surface () on the structure (). The reference circuit () is in fluidic isolation from the surface () of the structure (). The monitoring device () takes simultaneous measurements of a common fluidic characteristic of the circuits () and (), and produces a signal indicative the integrity of the structure based on a difference between the simultaneously measured common characteristic.