The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 08, 2013

Filed:

Feb. 22, 2010
Applicants:

Hiromitsu Nakagawa, Kokubunji, JP;

Yasuhide Mori, Tokyo, JP;

Tomohiro Nakamura, Hachioji, JP;

Katsuro Kikuchi, Musashino, JP;

Inventors:

Hiromitsu Nakagawa, Kokubunji, JP;

Yasuhide Mori, Tokyo, JP;

Tomohiro Nakamura, Hachioji, JP;

Katsuro Kikuchi, Musashino, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Model data is generated from performance information sorted by day of the week, time period, and process status by a performance information analysis section and a process status analysis section. An abnormality determination section detects abnormality using appropriate model data. What the graph of an expected status is like, how much the graph of the current status that has been determined abnormal differs from the graph of the expected status, and how much the current status is like the expected status are displayed allowing a system manager to observe detailed information about abnormality determination.


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