The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 08, 2013
Filed:
Nov. 18, 2009
Applicants:
William Fetter, St. Charles, IL (US);
Eric John Bennett, Fond du Lac, WI (US);
Wilhelmus Weekers, East Greenwich, RI (US);
Gary W. Russell, East Greenwich, RI (US);
Inventors:
William Fetter, St. Charles, IL (US);
Eric John Bennett, Fond du Lac, WI (US);
Wilhelmus Weekers, East Greenwich, RI (US);
Gary W. Russell, East Greenwich, RI (US);
Assignee:
Hexagon Metrology, Inc., North Kingstown, RI (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/008 (2006.01);
U.S. Cl.
CPC ...
Abstract
A manipulable aid which is separate and distinct from the probe of a CMM permits a CMM operator to more directly interact with a CMM measurement volume to align a workpiece, configure a measurement path, and/or program a dimensional metrology application.