The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 08, 2013
Filed:
Feb. 25, 2008
Michael L. Myrick, Irmo, SC (US);
Luisa Profeta, Richland, WA (US);
Michael L. Myrick, Irmo, SC (US);
Luisa Profeta, Richland, WA (US);
Halliburton Energy Services, Inc., Houston, TX (US);
Abstract
The present subject matter is direct to methodologies for calibrating data obtained from an optical analysis system. An initial calibration matrix of sampled analyte concentrations is modified using mean-centering techniques and selection of low and high analyte concentration spectra to produce a two-point calibration. A modified calibration matrix is produced by generating a non-linear calibration matrix by multiplying the initial calibration matrix by the two-point calibration. In an alternate embodiment, an initial multivariate optical element design is modified by iteratively adjusting the design based on standard error of calibration determination based on non-linerly fitted functions.