The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 08, 2013
Filed:
Mar. 25, 2009
Naoya Ooue, Gunma-ken, JP;
Naoya Ooue, Gunma-ken, JP;
Victor Company of Japan, Ltd., Yokohama, JP;
Abstract
There is a sequence of samples having values representative of a waveform. Samples corresponding to extrema including maximums and minimums in the waveform are detected. A decision is made as to whether values of successive samples between every two extremum-corresponding samples are in an upward slope or a downward slope. The number of these successive samples is detected. One is selected from coefficients in response to the detected sample number. A first group has one or more samples adjacently preceding a maximum-corresponding sample. A second group has one or more samples adjacently following the maximum-corresponding sample. A third group has one or more samples adjacently preceding a minimum-corresponding sample. A fourth group has one or more samples adjacently following the minimum-corresponding sample. Each of specified samples among the samples in the first to fourth groups is corrected in response to the slope decision result and the selected coefficient.